Dr. Niklas Mevenkamp

Dr. Niklas Mevenkamp

Member

AICES

Advisor / Co. Advisor

Prof. Berkels / Prof. Dahmen

Dissertation

Non-local Denoising and Unsupervised Quantitative Analysis in Scanning Transmission Electron Microscopy

Contact

AICES Graduate School
RWTH Aachen University
Schinkelstr. 2
D-52062 Aachen
Germany

Office: room 431 b (Rogowski building, 4th floor)
Phone: +49(0)241 80 99 140
Fax: +49(0)241 80 628 498
Email: mevenkamp@aices.rwth-aachen.de

Education

11/2013 - 04/2017 Doctoral student at AICES Graduate School, RWTH Aachen University, Germany
10/2011 - 09/2013 Master of Science in Mathematics, RWTH Aachen University, Germany
10/2008 - 09/2011 Bachelor of Science in Mathematics, RWTH Aachen University, Germany

Professional Career

09/2011 - 09/2013 Student Assistant, Central Facility for Electron Microscopy, RWTH Aachen, Germany
04/2011 - 07/2011 Student Assistant, Institute for Geometry and Practical Mathematics, RWTH Aachen, Germany
09/2009 - 03/2011 Student Assistant, Central Facility for Electron Microscopy, RWTH Aachen, Germany

Research Interests

Mathematical Image Processing and Inverse Modeling in Electron Microscopy, Non-local Regularization techniques, Variational Image Processing (segmentation, registration, pattern recognition), Simulation of Electron Transport using Monte Carlo methods and Deterministic Partial Differential Equation Models.

Code projects

ELMA - ELectron Micrograph Analysis: GUI application for MacOSX & Windows implementing the EM denoising and analysis methods developed during my PhD research.
Project website | GitHub repository
PCA-MS: Variational multi-phase segmentation based on high-dimensional local features.
Project website | GitHub repository | Data & Results | Benchmark
Unit cell extraction: Unsupervised and Accurate Extraction of Primitive Unit Cells from Crystal Images.
Project website | GitHub repository

Publications

Refereed Journal Publications

N. Mevenkamp, P. Binev, W. Dahmen, P.M. Voyles, A.B. Yankovich, and B. Berkels: Poisson Noise removal from high-resolution STEM images based on periodic block-matching, Advanced Structural and Chemical Imaging, 1:3, (2015).
[ PDF | DOI | BIB ]

Peer Reviewed Conference Proceedings

N. Mevenkamp, and B. Berkels: Variational multi-phase segmentation using high-dimensional local features, 2016 IEEE Winter Conference on Applications of Computer Vision (WACV), Lake Placid, NY, USA, pp. 1-9, (2016).
[ DOI | BIB | Poster | Slides ]
N. Mevenkamp, P. Pinard, S. Richter, and M. Torrilhon: On a Hyperbolic Conservation Law of Electron Transport in Solid Materials for Electron Probe Microanalysis, Bulletin of the Brazilian Mathematical Society, New Series, Springer, (2016).
[ PDF | DOI | Slides ]
N. Mevenkamp, and B. Berkels: Unsupervised and Accurate Extraction of Primitive Unit Cells from Crystal Images, in J. Gall, P. Gehler, and B. Leibe (Eds.), GCPR 2015, Springer International Publishing, 9358, pp. 105-116, (2015).
[ PDF | DOI | BIB | Slides ]
N. Mevenkamp, A.B. Yankovich, P.M. Voyles, and B. Berkels: Non-local Means for Scanning Transmission Electron Microscopy Images and Poisson Noise based on Adaptive Periodic Similarity Search and Patch Regularization, in J. Bender, A. Kuijper, T. von Landesberger, H. Theisel, and P. Urban (Eds.), VMV 2014, pp. 63–70. Eurographics Association, Darmstadt, Germany, (2014).
[ PDF | DOI | BIB | Slides ]

Peer Reviewed Conference Abstracts

N. Mevenkamp, and B. Berkels: Non-local averaging in EM: decreasing the required electron dose in crystal image reconstruction without losing spatial resolution, 16th European Microscopy Congress (EMC), Lyon, France, 5075, (2016).
[ DOI ]
B. Berkels, and N. Mevenkamp: Denoising of atomic-scale images based on automatic grain segmentation, unsupervised primitive unit cell extraction and periodic block-matching, Microscopy and Microanalysis, 22(S3), pp. 1404-1405, (2016).
[ DOI ]
S. Richter, P.T. Pinard, N. Mevenkamp, and M. Torrilhon: High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach, Microscopy and Microanalysis, 19(S2), pp. 1296–1297, (2013).
[ DOI ]

 

Thesis

Inverse Modeling in Electron Probe Microanalysis based on Deterministic Transport Equations, Master's Thesis, Center for Computational Engineering Science, Mathematics division, and Central Facility for Electron Microscopy, RWTH Aachen, (2013).
[ PDF | URN | BIB | Slides ]